Electron microscopy shows 'mouse bite' defects in semiconductors

2 comments

• loopback_device 1 hour ago
  Original article: https://www.nature.com/articles/s41467-026-69733-1
• 0xDEFACED 1 hour ago
  any hope that this could be applied to improving memory fab yields and ease some of the capacity constraints on consumer devices? asking for a friend
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  • lovich 38 minutes ago
    Less likely than just inducing more demand from the AI firms